Product
Product
Center
High Voltage SMU 2300
Features
  • High voltage (3000V@20mA, 1500V@120mA) range
  • Charactering as an accurate, fast, agile and easy-handling product.
  • Providing 4 quadrants voltage / current output, which accelerates the process of developing, production line and environmental reliability test.
  • Designed for analyzing and testing power semiconductor, especially for Si/SiC MOSFET and IGBT parameter test.
Parameters

Voltage Source

Voltage Measurement
Range Programming Resolution Accuracy
(% + offset)
Programming Resolution Accuracy
(% + offset)
200V

5mV

±(0.03%+50mV) 100uV ±(0.05%+100mV)

500V

10mV ±(0.03%+125mV) 100uV ±(0.05%+200mV)
1500V 40mV ±(0.03%+375mV)

1mV

±(0.05%+600mV)
3000V 80mV ±(0.03%+750mV)

1mV

±(0.05%+1.2V)

 

 

Current Source

Current Measurement
Range Programming Resolution Accuracy
(% + offset)
Programming Resolution Accuracy
(% + offset)
1nA

30fA

±(0.1%+2E–12+Vo×1e–15) 1fA ±(0.1% + 1e–12 + Vo×5e–15)
10nA 300fA

±(0.1%+5E–12+Vo×1e–15)

10fA ±(0.1% + 4e–12 + Vo×5e–15)
100nA 3pA ±(0.1%+6E–11+Vo×1e–13)

100fA

±(0.1% + 7e–13 + Vo×1e–15)
1uA 30pA ±(0.03%+700 pA)

1pA

±(0.08%+800 pA)
10uA 300pA ±(0.03%+5 nA)

10pA

±(0.08%+3 nA)
100uA 3nA ±(0.03%+60 nA)

100pA

±(0.05%+50 nA)
1mA 30nA ±(0.03%+300 nA)

1nA

±(0.05%+400 nA)
2mA 60nA ±(0.03%+1.2 µA)

1nA

±(0.05%+1 µA)
20mA 600nA ±(0.03%+12 µA)

10nA

±(0.05%+10 µA)
120mA 3uA ±(0.03%+36 µA)

10nA

±(0.05%+50 µA)
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Contact Us
Message

Thank you for choosing Planck. If you have any business cooperation needs, please feel free to leave a message online. We will properly protect and legally use the information you provide, and arrange for business personnel to contact you as soon as possible!