PlANCK offers a comprehensive portfolio of Source Measure Units (SMUs) capable of delivering high-voltage output, pulsed high-current output, and highly accurate voltage and current sampling. These capabilities address various test requirements for power semiconductors, such as breakdown voltage (BV), leakage current (IS), on-resistance (Rds(on)), gate threshold voltage (Vth), and bipolar characterization.

PLANCK Source Measure Units (SMUs) feature rapid output response, with a settling time of <5 ms for 3000 V output voltage and <20 μs for 2000 A output current. They also deliver high accuracy and excellent consistency in both voltage and current output, making them suitable for high-bandwidth precision testing of various detectors and sensors.

PLANCK offers a comprehensive portfolio of voltage and current sourcemeters capable of high-voltage output, pulsed high-current output, and highly accurate voltage and current sampling with resolutions up to 1 fA/10 nV. These capabilities meet a wide range of electrical characterization needs for new materials, including Hall effect measurements, resistivity testing, leakage current testing, and dielectric strength testing.